The magneto-optical voigt parameter from magneto-optical ellipsometry data for multilayer samples with single ferromagnetic layer

Calculations of the magneto-optical Voigt parameter $Q$ were carried out using various models of reflecting media for thin films Fe|SiO$_2$|Si(100) samples using the data of the in situ magneto-ellipsometry. The obtained spectral dependences of $Q$ make it possible to choose the algorithm for the analysis of experimental magneto-ellipsometry data and demonstrate that magneto-optical parameter $Q$ of iron is thickness-dependent.