$\mathbf{\sigma} $ and $\mathbf{\pi}$-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements

Resonant inelastic X-Ray scattering of highly oriented pyrolytic graphite (HOPG) is observed above the C 1s threshold at different polarization angles. It is shown that combining the polarization and excitation energy dependence of X-Ray emission spectra makes it possible to perform the quantitative band mapping selective to the chemical bonding ($\sigma $ and $\pi $).