A. V. Stanchik, V. A. Chumak, V. F. Gremenok, S. M. Baraishuk, “A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films”, Mendeleev Commun., 31:5 (2021), 726

Эта публикация цитируется в 2 статьях

Communications

A low-temperature X-ray diffraction study of the Cu₂ZnSnSe₄ thin films

A. V. Stanchik^a, V. A. Chumak^a, V. F. Gremenok^a, S. M. Baraishuk^b

^a Scientific and Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, Belarus
^b Department of Practical Training of Students, Belorussian State Technical Agrarian University, Minsk, Belarus

$Graphic abstract: A low-temperature X-ray diffraction study of the Cu<sub>2</sub>ZnSnSe<sub>4</sub> thin films$

Аннотация: Low-temperature XRD measurements were performed to confirm the phase composition and structural parameters of the electrochemically deposited Cu₂ZnSnSe₄ thin films on flexible metal substrates.

Ключевые слова: electrochemical deposition, flexible metal substrates, thin films, Cu₂ZnSnSe₄, low-temperature X-ray studies.

Язык публикации: английский

DOI: 10.1016/j.mencom.2021.09.045