Аннотация:
Shungites have been studied by high-resolution transmission electron microscopy (HRTEM). Two types of carbon layers have been revealed in shungites by HRTEM. The first type, graphite-like carbon layers are characterized by strongly marked hexagonal symmetry. The second type are remarkable for imperfections connected with insignificant disorder in the direction of fringes and the distance between them, and can result from point defects or the pentagonal and heptagonal carbon rings that are signs of fullerene-like structures.
Ключевые слова:Shungite, High-resolution electron microscopy, Molecular structure.