Methodology of analyzing the CdSe semiconductor quantum dots parameters

Direct methods (using a laser particle size analyzer) and indirect (from the analysis of spectral characteristics and differential normalized tunnel CVC) methods of CdSe QD size estimation allowed determination of the size (4–5 nm) and shown good qualitative and quantitative agreement of the results with an error of less than 10%. It is concluded that the tunnel differential CVC analysis is an effective method for express measurement that can be used in quantum-size object investigations.