M. M. Khalisov, V. A. Lebedev, A. S. Poluboyarinov, A. V. Garshev, E. K. Khrapova, A. A. Krasilin, A. V. Ankudinov, “Young's modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation”, Наносистемы: физика, химия, математика, 2021, том 12, выпуск 1,страницы 118

Эта публикация цитируется в 5 статьях

CHEMISTRY AND MATERIAL SCIENCE

Young's modulus of phyllosilicate nanoscrolls measured by the AFM and by the in-situ TEM indentation

M. M. Khalisov^ab, V. A. Lebedev^c, A. S. Poluboyarinov^d, A. V. Garshev^d, E. K. Khrapova^a, A. A. Krasilin^a, A. V. Ankudinov^a

^a Ioffe Institute, Politekhnicheskaya, 26, Saint-Petersburg 194021, Russian Federation
^b Pavlov Institute of Physiology, Russian Academy of Sciences, Makarova emb., 6, Saint-Petersburg, 199034, Russian Federation
^c University of Limerick, Limerick, V94 T9PX, Ireland
^d Lomonosov Moscow State University GSP-1, Leninskie Gory, Moscow, 119991, Russian Federation

Аннотация: Ni$_3$Si$_2$O$_5$(OH)$_4$ phyllosilicate nanoscrolls were investigated by two techniques: the bending-based test method of AFM and the indentation method with visual control in STEM. In the first case, the average measured Young's modulus, about 200 GPa, turned out to be significantly higher than in the second one, 40 GPa. The reasons for this discrepancy are analyzed.

Ключевые слова: AFM, in-situ TEM, nanomechanics, indentation, Young's modulus.

PACS: 07.79.Lh, 87.64.Ee

Поступила в редакцию: 10.12.2020
Исправленный вариант: 01.02.2021

Язык публикации: английский

DOI: 10.17586/2220-8054-2021-12-1-118-127