Birth date: 18.11.1985
Phone: +7 (915) 327 52 72
Keywords: Thermoelastic stresses, current impulses

Subject:

Semiconductors, thermal degradation, defect formation

Main publications:

1. A.A. Skvortsov, S.M. Zuev, M.V. Koryachko, V. Glinskiy, “Thermal shock and degradation of metallization systems on silicon”, Microelectronics International, 33:2 (2016), 102-106

Publications in Math-Net.Ru

Personal pages:

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Organisations:

• Moscow Polytechnic University