Физика и техника полупроводников,
2018 , том 52, выпуск 5, страница 509
(Mi phts5835)
XXV International Symposium ''Nanostructures: Physics and Technology'', Saint Petersburg, June 26-30, 2017
Nanostructure Characterization
Optical properties of GaN nanowires grown by MBE on SiC/Si(111) hybrid substrate
I. V. Shtrom abc ,
N. G. Filosofov c ,
V. F. Agekyan c ,
M. B. Smirnov c ,
A. Yu. Serov c ,
R. R. Reznik abd ,
K. E. Kudryavtsev e ,
G. E. Cirlin abd a St. Petersburg Academic University, Russian Academy of Sciences,
194021 St. Petersburg, Russia
b Institute for Analytical Instrumentation, Russian Academy of Sciences, 190103 St. Petersburg, Russia
c St. Petersburg State University, 199034 St. Petersburg, Russia
d ITMO University, 197101 St. Petersburg, Russia
e Institute for Physics of Microstructures of the Russian Academy of Sciences, 603950 Nizhny Novgorod, Russia
Аннотация:
The aim of this work is to demonstrate the fundamental possibility of Si-doped GaN nanowires growth on the buffer layer of silicon carbide on silicon substrate and to investigate the optical characteristics of this structures.
Язык публикации: английский
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