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ЖУРНАЛЫ // Физика и техника полупроводников // Архив

Физика и техника полупроводников, 2018, том 52, выпуск 4, страница 477 (Mi phts5873)

Эта публикация цитируется в 2 статьях

XXV International Symposium ''Nanostructures: Physics and Technology'', Saint Petersburg, June 26-30, 2017
Quantum wells, Quantum wires, Quantum dots, band structure

Density control of InP/GaInP quantum dots grown by metal-organic vapor-phase epitaxy

D. V. Lebedeva, N. A. Kalyuzhnyya, S. A. Mintairova, K. G. Belyaeva, M. V. Rakhlina, A. A. Toropova, P. N. Brunkovab, A. S. Vlasova, J. Merzc, S. Rouvimovc, S. Oktyabrskyd, M. Yakimovd, I. V. Mukhine, A. V. Shelaevf, V. A. Bykovf, A. Yu. Romanovab, P. A. Buryakb, A. M. Mintairovac

a Ioffe Institute, 194021 St. Petersburg, Russia
b St. Petersburg Polytechnical University, 195251 St. Petersburg, Russia
c University of Notre Dame, USA. IN 46556. Notre Dame
d Institute for Materials, State University of New York at Albany, USA. NY 12203. Albany.251 Fuller Rd.
e St. Petersburg Academic University, Russian Academy of Sciences, 194021 St. Petersburg, Russia
f NT-MDT Spectrum Instruments, 124460 St. Petersburg, Russia

Аннотация: We investigated structural and emission properties of self-organized InP/GaInP quantum dots (QD) grown by metal organic chemical vapor deposition using an amount of deposited In from 7 to 2 monolayers (ML). In the uncapped samples, using atomic force microscopy (AFM), we observed lateral sizes of 100–200 nm, together with a bimodal height distribution having maxima at $\sim$5 and $\sim$15 nm, which we denoted as QDs of type $A$ and $B$, respectively; and reduction of the density of the type-$B$ dots from 4.4 to 1.6 $\mu$m$^{-2}$. The reduction of the density of $B$-type dots were observed also using transmission electron microscopy of the capped samples. Using single dot low-temperature photoluminescence (PL) spectroscopy we demonstrated effects of Wigner localization for the electrons accumulated in these dots.

Язык публикации: английский


 Англоязычная версия: Semiconductors, 2018, 52:4, 497–501

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