Аннотация:
Photosensitive nanostructured heterojunctions $n$-TiN/$p$-Si were fabricated by means of titanium nitride thin
films deposition ($n$-type conductivity) by the DC reactive magnetron sputtering onto nanostructured single crystal
substrates of $p$-type Si (100).
The temperature dependencies of the height of the potential barrier and series resistance of the $n$-TiN/$p$-Si
heterojunctions were investigated. The dominant current transport mechanisms through the heterojunctions under
investigation were determined at forward and reverse bias.
The heterojunctions under investigation generate open-circuit voltage $V_{oc}$ = 0.8 V, short-circuit current
$I_{sc}$ = 3.72 mA/cm$^2$ and fill factor $FF$ = 0.5 under illumination of 100 mW/сm$^2$.
Поступила в редакцию: 20.09.2016 Принята в печать: 29.09.2016