Численный метод анализа нелокальных данных с пленочных терморезисторов электронных плат

An algorithm is proposed for determining the areas of overheating of a printed circuit board with electronic components and the temperature of overheating by analyzing nonlocal data from extended film thermistors. The algorithm is based on the physical-mathematical model of the temperature field of the board, as well as some qualitative characteristics of thermal states under study, which compensate the underdefinition of the original mathematical formulation. The results of computational experiments illustrating the operability of the algorithm are presented.