Technical Diagnostics

Iddq testing-based diagnosis of faults in CMOS-circuits

Yu. V. Bykov^a, A. A. Ivanyuk^a, A. I. Yanushkevich, V. N. Yarmolik<sup>a

a</sup> Belarussian State University of Computer Science and Radioelectronic Engineering

UDC: 681.3

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 03.06.1997

 English version: Automation and Remote Control, 1999, 60:7, 1021–1020

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