Reliability models for specialized computational devices with different fault types and temporal relations

We study the problem of analyzing reliability characteristics of specialized computational devices with combined reservation taking into account fault types and temporal relations. We introduce a reliability criterion as the probability of functionally faultless operation. We propose new reliability models that take into account the distribution function of the time when the fault appears, the time when it is detected and so on. We find precision parameters for modeling results.

Presented by the member of Editorial Board: P. P. Parkhomenko