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JOURNALS // Avtomatika i Telemekhanika // Archive

Avtomat. i Telemekh., 2005 Issue 8, Pages 161–172 (Mi at1425)

This article is cited in 30 papers

Technical Diagnostics

Checking combinational circuits by the method of logic complement

M. Goessela, A. V. Morozovb, V. V. Sapozhnikovb, Vl. V. Sapozhnokovb

a University of Potsdam, Potsdam, Germany
b Petersburg State Transport University

Abstract: Design of fully self-testing combinational circuits was considered. A theorem defining the conditions for guaranteed logic complement-based design of fully self-testing circuit was proved. Examples were presented.

Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 05.05.2004


 English version:
Automation and Remote Control, 2005, 66:8, 1336–1346

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