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// Avtomatika i Telemekhanika
// Archive
Avtomat. i Telemekh.,
2005
Issue 8,
Pages
161–172
(Mi at1425)
This article is cited in
30
papers
Technical Diagnostics
Checking combinational circuits by the method of logic complement
M. Goessel
a
,
A. V. Morozov
b
,
V. V. Sapozhnikov
b
,
Vl. V. Sapozhnokov
b
a
University of Potsdam, Potsdam, Germany
b
Petersburg State Transport University
Abstract:
Design of fully self-testing combinational circuits was considered. A theorem defining the conditions for guaranteed logic complement-based design of fully self-testing circuit was proved. Examples were presented.
Presented by the member of Editorial Board:
P. P. Parkhomenko
Received:
05.05.2004
Fulltext:
PDF file (231 kB)
References
Cited by
English version:
Automation and Remote Control, 2005,
66
:8,
1336–1346
Bibliographic databases:
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Steklov Math. Inst. of RAS
, 2024