Technical Diagnostics

Built-in self-test scanners for very large-scale integration: a new design approach

I. A. Murashko, A. M. Shmidman, V. N. Yarmolik

Belarussian State University of Computer Science and Radioelectronic Engineering

UDC: 681.326.7


Received: 25.10.1996

 English version: Automation and Remote Control, 1998, 59:7, 1032–1039

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