This article is cited in 1 paper

Technical Diagnostics

Functional testing of RISC-microprocessors

A. V. Koshevenko, S. G. Sharshunov

Far-Eastern State Technical University

UDC: 681.325


Received: 29.05.1997

 English version: Automation and Remote Control, 1998, 59:10, 1469–1477

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