Yu. V. Bykov, L. A. Zakrevskiĭ, V. N. Yarmolik, “Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits”, Avtomat. i Telemekh., 1994, Issue 4,Pages <nobr>144

JOURNALS // Avtomatika i Telemekhanika // Archive

Avtomat. i Telemekh., 1994 Issue 4, Pages 144–150 (Mi at3891)

Technical Diagnostics

Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits

Yu. V. Bykov, L. A. Zakrevskiĭ, V. N. Yarmolik

Minsk Institute of Radio Technology

UDC: 681.326.7

Received: 30.07.1993

Fulltext: PDF file (2013 kB)

English version: Automation and Remote Control, 1994, 55:4, 576–581

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