This article is cited in 1 paper

Technical Diagnostics

Nondestructive testing of memory elements by built-in parity-check facilities

L. A. Zakrevskiy, A. A. Ivanyuk, A. I. Yanushkevich, V. N. Yarmolik

Belarussian State University of Computer Science and Radioelectronic Engineering

UDC: 681.3


Received: 13.02.1997

 English version: Automation and Remote Control, 1999, 60:2, 243–249

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