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JOURNALS // Avtomatika i Telemekhanika // Archive
Avtomat. i Telemekh., 1990 Issue 5, Pages 147–156 (Mi at5377)
Technical Diagnostics

Structural-linguistic approach to pseudorandom testing of microprocessors

V. I. Borshchevich

Chishinau Technical Institute named after S. Lazo

UDC: 681.325.5


Received: 01.06.1988


 English version: Automation and Remote Control, 1990, 51:5, 694–701

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© Steklov Math. Inst. of RAS, 2025