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JOURNALS // Avtomatika i Telemekhanika // Archive
Avtomat. i Telemekh., 1990 Issue 9, Pages 118–129 (Mi at5937)
Technical Diagnostics

Logical Dynamic Testing of Synchronous CMOS VLSI

V. M. Krivoshapko, D. O. Levitsky

Moscow Electronic Engineering Institute

UDC: 621.382.8:681.326.7


Received: 14.04.1989


 English version: Automation and Remote Control, 1990, 51:9, 1258–1266

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© Steklov Math. Inst. of RAS, 2024