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JOURNALS // Avtomatika i Telemekhanika // Archive
Avtomat. i Telemekh., 1979 Issue 10, Pages 123–128 (Mi at9554)
Technical Diagnostics

Analysis of the dynamic fault risk from cubic covers of logical circuits

V. N. Golinichev, O. F. Nemolochnov

Leningrad

Abstract: The tools of cubic complex calculus are shown to be applicable to analysis and elimination of the dynamic fault risk in test sequences constructed for checking combinational and sequential circuits.

UDC: 681.325.6.001.4


Received: 11.12.1978


 English version: Automation and Remote Control, 1980, 40:10, 1505–1508

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© Steklov Math. Inst. of RAS, 2024