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JOURNALS // Computational nanotechnology // Archive

Comp. nanotechnol., 2017 Issue 2, Pages 85–88 (Mi cn129)

This article is cited in 2 papers

PLASMA, HIGH-FREQUENCY, MICROWAVE AND LASER TECHNOLOGY

The use of ergonometry based on silicon surface barrier detectors to monitor radon

R. Kh. Rakhimova, R. A. Muminovb, S. A. Radzhapovb, Yu. S. Pindurinb, B. S. Radzhapovb

a Institute of materials science, «Physics-sun». Uzbekistan Academy of sciences
b Physical-technical Institute, SPA «Physics-Sun», Academy of Sciences of the Republic of Uzbekistan

Abstract: In the article the questions of application of ergonometry to control the concentration of radon in air, water, soil and material.

Keywords: semiconductor detector, a photodetector, scintillator, gamma radiation, x-ray radiation.



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