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JOURNALS // Computational nanotechnology // Archive

Comp. nanotechnol., 2017 Issue 3, Pages 27–28 (Mi cn141)

PLASMA, HIGH-FREQUENCY, MICROWAVE AND LASER TECHNOLOGY

Detectors of X-ray and gamma radiation on the basis of Al-nGe-pSi-Au structure

R. A. Muminov, S. A. Radzhapov, Y. Q. Toshmurodov, B. S. Radzhapov

Physical-technical Institute, SPA «Physics-Sun», Academy of Sciences of Uzbekistan

Abstract: This paper, features of the development of nuclear radiation detectors 10 mm and thicknesses 1.4 mm of the sensitive region based on Al-nGe-pSi-Au structures are presented. The features of their volt-ampere and radiometric characteristics are shown.

Keywords: Semiconductor Al-nGe-pSi-Au detector, monocrystalline silicon, sensitive region, «dead» layer.



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