RUS  ENG
Full version
JOURNALS // Computational nanotechnology // Archive

Comp. nanotechnol., 2021 Volume 8, Issue 2, Pages 87–93 (Mi cn340)

This article is cited in 2 papers

INTELLIGENT TECHNICAL SYSTEMS IN MANUFACTURING AND INDUSTRIAL PRACTICE

Experimental study of metrological parameters of quality control

E. B. Isgandarzada, G. S. Valiyev, Sh. V. Ahmadli, U. R. Islamova

Azerbaijan Technical University

Abstract: The article discusses the rational use of all types of resources at the enterprise; improving the quality of management decisions; mastering innovative technologies; increasing labor productivity; improving product quality; the possibility of unpredictable processing and waste of products using models built on the use of S-charts, aimed at timely and high-quality order fulfillment. Estimation of the probable parameters of the model of the metrological support system allows to reduce the costs and time for process control, reduce the cost of production, as well as effectively distribute labor, material and financial resources.

Keywords: graphic models, coordinate metrology, deviations, quality indicators, metrological support system, probabilistic parameters, identification algorithm.

Received: 18.05.2021

DOI: 10.33693/2313-223X-2021-8-2-87-93



© Steklov Math. Inst. of RAS, 2025