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JOURNALS // Computational nanotechnology // Archive

Comp. nanotechnol., 2016 Issue 4, Pages 136–137 (Mi cn99)

PLASMA, HIGH-FREQUENCY, MICROWAVE AND LASER TECHNOLOGY

The ionizing radiation detectors based on neutron-doped silicon

R. A. Muminova, S. A. Radzhapova, B. S. Radzhapova, R. Kh. Rakhimovb

a Physical-technical Institute, SPA «Physics-Sun», Academy of Sciences of the Republic of Uzbekistan
b Institute of materials science, «Physics-sun». Uzbekistan Academy of sciences

Abstract: The article considers features of development of detectors of ionizi-roumega radiation with the working area $S\geq30$ mm$^2$ and a thickness of $W>0.2$ mm, based on single crystals of compensated neutron doping of silicon. Peculiarities of electrophysical and spectral characteristics.

Keywords: monocrystalline silicon, neutron-doped silicon, «input» and «output» window of the detector degradation, energy times-the decision.



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