V. V. Kolyuchkin, E. Yu. Zlokazov, S. B. Odinokov, V. E. Talalaev, I. K. Tsyganov, “A coherent measurement method for checking the surface microrelief depth in holographic and diffractive optical elements”, Computer Optics, 2015, Volume 39, Issue 4,Pages <nobr>515

This article is cited in 7 papers

OPTO-IT

A coherent measurement method for checking the surface microrelief depth in holographic and diffractive optical elements

V. V. Kolyuchkin^a, E. Yu. Zlokazov^b, S. B. Odinokov^a, V. E. Talalaev^a, I. K. Tsyganov^a

^a Bauman Moscow State Technical University
^b National Research Nuclear University MEPhI

Abstract: Security holograms have been widely used for document and product authenticity protection. The quality of security holograms and master-matrices significantly depends on the perfection of the diffraction grating. The authors introduce a method for checking the security hologram quality based on indirect measurements of diffraction grating parameters. Theoretical results concerned with the use of this method for microrelief quality control are discussed.

Keywords: holography, diffraction gratings, diffraction theory, holographic optical elements, diffractive optical elements.

Received: 23.06.2015
Revised: 29.09.2015

DOI: 10.18287/0134-2452-2015-39-4-515-520