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JOURNALS // Computer Optics // Archive

Computer Optics, 2017 Volume 41, Issue 3, Pages 356–362 (Mi co393)

This article is cited in 3 papers

OPTO-IT

Subwavelength focusing of laser light using a chromium zone plate

A. G. Nalimovab, S. S. Stafeevab, E. S. Kozlovaab, V. V. Kotlyarab, L. O'Faolainc, M. V. Kotlyarb

a Samara National Research University, Samara, Russia
b Image Processing Systems Institute of the RAS - Branch of the FSRC "Crystallography and Photonics" RAS, Samara, Russia
c SUPA, School of Physics and Astronomy of the University of St. Andrews, Scotland

Abstract: We study in which way the parameters of a focal spot generated by a chromium zone plate $15$-$\mu$m in diameter synthesized by sputtering on a glass substrate and having a focal length equal to the incident wavelength of $\lambda = 532$ nm depend on the microrelief height. It is shown numerically that an optimal microrelief height of the zone plate is $70$ nm. With these parameters, the minimal size of the focal spot is achieved. Using a scanning near field optical microscope the said zone plate is shown to focus a linearly polarized Gaussian beam into an elliptical focal spot having the full-width at half-maximum of $\mathrm{FWHM}_x = 0.42\lambda$ and $\mathrm{FWHM}_y = 0.64\lambda$ along the Cartesian axes.

Keywords: amplitude zone plate, phase zone plate, sharp focus, FDTD method, scanning near field optical microscope.

Received: 05.05.2017
Accepted: 15.05.2017

DOI: 10.18287/2412-6179-2017-41-3-356-362



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