RUS  ENG
Full version
JOURNALS // Computer Optics // Archive

Computer Optics, 2019 Volume 43, Issue 5, Pages 756–764 (Mi co700)

This article is cited in 22 papers

OPTO-IT

Design, fabrication and investigation of a silicon subwavelength terahertz axicon

S. N. Khoninaab, K. N. Tukmakovab, S. A. Degtyarevab, À. Ñ. Ðåøåòíèêîâb, V. S. Pavel'evab, B. A. Knyazevbcd, Yu. Yu. Choporovacdb

a IPSI RAS – Branch of the FSRC “Crystallography and Photonics” RAS, Molodogvardeyskaya 151, 443001, Samara, Russia
b Samara National Research University, 443086, Russia, Samara, Moskovskoye Shosse 34
c Budker Institute of Nuclear Physics of SB RAS, Novosibirsk, Russia
d Novosibirsk State University, Novosibirsk, Russia

Abstract: A silicon subwavelengh terahertz axicon has been designed, fabricated, and investigated by methods of numerical and optical experiments. The research has been performed on a free-electron laser workstation NOVOFEL (Budker Institute of Nuclear Physics of SB RAS, Novosibirsk). Diffractive and polarization features of realized element have been investigated.

Keywords: diffractive optical element, free electron laser, terahertz radiation, subwavelength axicon.

Received: 04.09.2019
Accepted: 13.09.2019

DOI: 10.18287/2412-6179-2019-43-5-756-764



© Steklov Math. Inst. of RAS, 2024