A method for optimal value measurement of some parameters of fault attacks on cryptographic algorithms

This paper is devoted to the construction of a time-optimal method for measuring the maximum permissible (critical) value of the supply voltage (as well as other parameters) of the device on which the cryptographic algorithm is performed. Knowledge of these values is necessary for successful conduct of error injection, as part of a fault attack. The method is based on dynamic programming. Bibliogr. 11.