On reliability of circuits realizing ternary logic functions

We consider a realization of the ternary logics functions by the circuits with unreliable functional gates in a full finite basis. It is assumed that gates turn in faulty condition independently and the faults can be arbitrary (e.g., inverse or constant). We describe a class $G$ of ternary logic functions whose circuits can be used to improve the reliability of initial circuits. With inverse faults on the outputs of the basic gates, using functions of the class $G$ constructively we prove that a function different from any variable can be realized with a reliable circuit (we remind that a function equal to a variable can be realized reliably without using functional elements). In particular, if the basis contains at least one function from $G$, then the proposed circuits are not only reliable, but asymptotically reliability optimal for all functions different from any variable. Ill. 2, bibliogr. 13.