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JOURNALS // Diskretnyi Analiz i Issledovanie Operatsii // Archive

Diskretn. Anal. Issled. Oper., 2017 Volume 24, Issue 3, Pages 80–103 (Mi da876)

This article is cited in 4 papers

On the exact value of the length of the minimal single diagnostic test for a particular class of circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics, 4 Miusskaya Sq., 125047 Moscow, Russia

Abstract: Under consideration is the problem of synthesis of irredundant logic circuits in the basis $\{\mathbin{\&},\vee,\neg\}$ which implement Boolean functions of $n$ variables and allow some short single diagnostic tests regarding uniform constant faults at outputs of gates. For each Boolean function permitting implementation by an irredundant circuit, the minimal possible length value of such a test is found. In particular, we prove that this value is at most $2$. Illustr. 3, bibliogr. 27.

Keywords: logic circuit, fault, single diagnostic test.

UDC: 519.718.7

Received: 08.06.2016
Revised: 27.02.2017

DOI: 10.17377/daio.2017.24.546


 English version:
Journal of Applied and Industrial Mathematics, 2017, 11:3, 431–443

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© Steklov Math. Inst. of RAS, 2025