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4 papers
Short complete fault detection tests for logic networks with fan-in two
K. A. Popkov Keldysh Institute of Applied Mathematics, 4 Miusskaya Square, 125047 Moscow, Russia
Abstract:
It is established that we can implement almost every Boolean function on
$n$ variables by a logic network in the basis
$\{x\,\&\, y,\, {x\vee y},$ ${x\oplus y}, \, 1\}$, allowing a complete fault detection test with length at most
$4$ under arbitrary stuck-at faults at outputs of gates. The following assertions are also proved: We can implement each Boolean function on
$n$ variables by a logic network in the basis
$\{x\,\&\,y,\, x\vee y,\, x\oplus y,\, 1\}$ (in the basis $\{x\,\&\,y,\, x\vee y,\, x\vee\overline y,\, x\oplus y\}$) containing at most one dummy variable and allowing a complete fault detection test of length at most
$5$ (at most
$4$, respectively) under faults of the same type. Illustr. 2, bibliogr. 24.
Keywords:
logic network, arbitrary stuck-at fault, complete fault detection test.
UDC:
519.718.7 Received: 16.07.2018
Revised: 02.08.2018
Accepted: 28.11.2018
DOI:
10.33048/daio.2019.26.623