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JOURNALS // Diskretnyi Analiz i Issledovanie Operatsii // Archive

Diskretn. Anal. Issled. Oper., 2019 Volume 26, Issue 1, Pages 89–113 (Mi da919)

This article is cited in 4 papers

Short complete fault detection tests for logic networks with fan-in two

K. A. Popkov

Keldysh Institute of Applied Mathematics, 4 Miusskaya Square, 125047 Moscow, Russia

Abstract: It is established that we can implement almost every Boolean function on $n$ variables by a logic network in the basis $\{x\,\&\, y,\, {x\vee y},$ ${x\oplus y}, \, 1\}$, allowing a complete fault detection test with length at most $4$ under arbitrary stuck-at faults at outputs of gates. The following assertions are also proved: We can implement each Boolean function on $n$ variables by a logic network in the basis $\{x\,\&\,y,\, x\vee y,\, x\oplus y,\, 1\}$ (in the basis $\{x\,\&\,y,\, x\vee y,\, x\vee\overline y,\, x\oplus y\}$) containing at most one dummy variable and allowing a complete fault detection test of length at most $5$ (at most $4$, respectively) under faults of the same type. Illustr. 2, bibliogr. 24.

Keywords: logic network, arbitrary stuck-at fault, complete fault detection test.

UDC: 519.718.7

Received: 16.07.2018
Revised: 02.08.2018
Accepted: 28.11.2018

DOI: 10.33048/daio.2019.26.623


 English version:
Journal of Applied and Industrial Mathematics, 2019, 13:1, 118–131

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© Steklov Math. Inst. of RAS, 2024