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JOURNALS
// Doklady Akademii Nauk
// Archive
Dokl. Akad. Nauk SSSR,
1964
Volume 156,
Number 6,
Pages
1339–1340
(Mi dan29763)
CRYSTALLOGRAPHY
Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
V. N. Rozhanskii
,
G. V. Berezhkova
Institute of Cristallography of the USSR Academy of Sciences, Moscow
Presented:
A. V. Shubnikov
Received: 19.02.1964
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Steklov Math. Inst. of RAS
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