CRYSTALLOGRAPHY

Relationship between the amorphization and the point defect formation during ionic bombardment of germanium and silicon

A. I. Gerasimov, E. I. Zorin, P. V. Pavlov, D. I. Tetelbaum

Scientific-Research Physicotechnical Institute at the Gor'kii State University

UDC: 539.1.043+539.213+539.27

Presented: N. V. Belov
Received: 01.07.1969