CRYSTALLOGRAPHY

Crystallization of amorphous silicon dioxide films during ion bombardment and subsequent annealing

P. V. Pavlov, È. V. Shitova, E. I. Zorin

Scientific-Research Physicotechnical Institute at the Gor'kii State University

UDC: 539.235

Presented: N. V. Belov
Received: 20.10.1969