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JOURNALS
// Doklady Akademii Nauk
// Archive
Dokl. Akad. Nauk SSSR,
1974
Volume 215,
Number 3,
Pages
562–564
(Mi dan38199)
PHYSICS
Mass-spectrometric study of the conditions of semiconductor amorphous film formation in the condensation from vapour phase
V. P. Zakharov
,
I. M. Protas
Kiev Scientific Research Institute of Microdevices
Presented:
B. E. Paton
Received: 11.05.1973
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Steklov Math. Inst. of RAS
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