CRYSTALLOGRAPHY

X-Ray spectral study of silicates. I. Structure of silicon $L_{\mathrm{II},\mathrm{III}}$ band

Yu. P. Dikov, Yu. N. Romashchenko, I. A. Brytov, V. V. Nemoshkalenko

Scientific-Research Institute of Glass, Moscow

UDC: 543.422.8:546.284

Presented: N. V. Belov
Received: 02.01.1975