CRYSTALLOGRAPHY

Diffraction of X-rays by mixed-layered structures with random distribution of packing defects

B. A. Sakharov, A. S. Naumov, V. A. Drits

Geological Institute, USSR Academy of Sciences, Moscow

UDC: 548.73:548.4

Presented: B. K. Vaĭnshteĭn
Received: 08.02.1982