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JOURNALS
// Doklady Akademii Nauk
// Archive
Dokl. Akad. Nauk SSSR,
1985
Volume 282,
Number 3,
Pages
608–611
(Mi dan47026)
CRYSTALLOGRAPHY
Possfoilities of X-ray topography investigations of the strain fields around microdefects
V. L. Indenbom
,
V. M. Kaganer
Institute of Cristallography of the USSR Academy of Sciences, Moscow
UDC:
548.732
Presented:
B. K. Vaĭnshteĭn
Received: 29.05.1984
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Steklov Math. Inst. of RAS
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