PHYSICS

Surface micro roughness influence on the induced absorption value in $\mathrm{Si}$ and $\mathrm{GaAs}$ at picosecond excitation

A. A. Bugaev, B. P. Zakharchenya, Yu. B. Kiselev, V. A. Lukoshkin

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

UDC: 621.315.592

Received: 07.07.1986