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JOURNALS
// Doklady Akademii Nauk
// Archive
Dokl. Akad. Nauk SSSR,
1988
Volume 301,
Number 4,
Pages
849–851
(Mi dan48354)
PHYSICS
Semiconductor structure investigation by the methods of acoustic and electron thermoacoustic microscopy
Yu. V. Gulyaev
,
M. A. Kulakov
,
A. I. Morosov
,
E. I. Rau
Institute of Radio Engineering and Electronics, Academy of Sciences of the USSR, Moscow
UDC:
621.385.833:534.6.88
Received: 28.04.1987
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Steklov Math. Inst. of RAS
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