CRYSTALLOGRAPHY

On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers

O. V. Konovalov, L. A. Feigin

Institute of Cristallography of the USSR Academy of Sciences, Moscow

UDC: 548.737+539.233

Presented: B. K. Vaĭnshteĭn
Received: 08.07.1991