This article is cited in 2 papers

Numerical methods

Analysis of inhomogeneities on wafers by the integral transform method

Yu. A. Eremin, V. I. Ivakhnenko

Lomonosov Moscow State University

UDC: 519.63

Received: 31.03.2000

 English version: Differential Equations, 2000, 36:9, 1370–1380

Bibliographic databases:

•