On reliability of circuits over the bases $\{\sim,\&,\oplus\}$, $\{\sim,\&,0\}$, $\{\oplus,\&,1\}$, $\{\oplus,\vee,1\}$ in the case of faults of type 0 at the outputs of elements
Abstract:
In the case of faults of type 0 at the outputs of elements, it is proved that in the bases $\{\sim,\&,\oplus\}$, $\{\sim,\&,0\}$, $\{\oplus,\&,1\}$, $\{\oplus,\vee,1\}$ almost all Boolean functions can be realised by asymptotically best (optimal) with respect to the reliability circuits functioning with unreliability $P(S)\sim\gamma$ as $\gamma\to0$, where $\gamma$ is the probability of the faulty state of an element.