This article is cited in 25 papers

Method of synthesis of easily testable circuits admitting single fault detection tests of constant length

D. S. Romanov

M. V. Lomonosov Moscow State University

UDC: 519.718

Received: 24.04.2012

DOI: 10.4213/dm1283

 English version: Discrete Mathematics and Applications, 2014, 24:4, 227–251

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