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JOURNALS // Diskretnaya Matematika // Archive
Diskr. Mat., 2017 Volume 29, Issue 2, Pages 53–69 (Mi dm1429)
This article is cited in 10 papers

Lower bounds for lengths of single tests for Boolean circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow

Abstract: We obtain nontrivial lower bounds for lengths of minimal single fault detection and diagnostic tests for Boolean circuits in wide classes of bases in presence of stuck-at faults at outputs of circuit gates.

Keywords: Boolean circuit, stuck-at fault, single fault detection test, single diagnostic test.

UDC: 519.718.7

Received: 16.09.2016

DOI: 10.4213/dm1429


 English version: Discrete Mathematics and Applications, 2019, 29:1, 23–33

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© Steklov Math. Inst. of RAS, 2024