I. G. Lyubich, D. S. Romanov, “Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases”, Diskr. Mat., 2021, Volume 33, Issue 1,Pages <nobr>20

This article is cited in 5 papers

Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases

I. G. Lyubich, D. S. Romanov

Lomonosov Moscow State University

Abstract: We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.

Keywords: Boolean circuit, single diagnostic test, inversion fault at gate output, Shannon function, easily testable circuit.

UDC: 519.718.7

Received: 21.01.2021

DOI: 10.4213/dm1629