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JOURNALS // Diskretnaya Matematika // Archive

Diskr. Mat., 2023 Volume 35, Issue 4, Pages 69–78 (Mi dm1790)

Short tests for contact circuits under one-type weakly connected faults of contacts

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow

Abstract: We prove that for any natural $k$ any Boolean function can be implemented by a two-pole contact circuit that is $k$-irredundant and allows a $k$-diagnostic test of length no more than $1$ relative to one-type connected faults of contacts in groups where each group consists of one closing and one opening contact.

Keywords: contact circuit, connected faults of contacts, fault detection test, diagnostic test, Boolean function.

UDC: 519.718.7

Received: 20.08.2023

DOI: 10.4213/dm1790



© Steklov Math. Inst. of RAS, 2025