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JOURNALS // Diskretnaya Matematika // Archive

Diskr. Mat., 2006 Volume 18, Issue 3, Pages 3–34 (Mi dm56)

This article is cited in 4 papers

Test recognition theory

V. B. Kudryavtsev


Abstract: We describe the logic approach to pattern recognition; its key notion is a test. Analysing the tests allows us to construct functionals characterising the pattern, as well as procedures to compute them. We present qualitative and quantitative properties of tests, functionals, and recognition procedures. Solutions of a series of known problems are also given.

UDC: 519.2

Received: 21.04.2006

DOI: 10.4213/dm56


 English version:
Discrete Mathematics and Applications, 2006, 16:4, 319–350

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