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JOURNALS // Fundamentalnaya i Prikladnaya Matematika // Archive

Fundam. Prikl. Mat., 2009 Volume 15, Issue 4, Pages 67–99 (Mi fpm1239)

This article is cited in 4 papers

Test recognition

V. B. Kudryavtsev, A. E. Andreev

M. V. Lomonosov Moscow State University

Abstract: We describe the logic approach to pattern recognition; its key notion is a test. Analyzing the tests allows us to construct functional characterizing the pattern, as well as procedures to compute them. We present qualitative and quantitative properties of tests, functionals, and recognition procedures. Solutions of a series of known problems are also given.

UDC: 519.95


 English version:
Journal of Mathematical Sciences (New York), 2010, 169:4, 457–480

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